William Neils: Advancing Correlative Microscopy

Abstract:

With the focus on nano-scale material becoming more commonplace, it is important to have useful tools that allow for more complete characterization of samples. This favors lab workflows that quickly provide correlated data across multiple measurement techniques. In this talk I will present both a top-down and bottom-up approach to the
combination of SEM and AFM microscopy techniques in a single instrument allowing for faster identification of areas of interest and better understand your AFM data.