Jesus Marquez

Major: Engineering Physics

Mentors: Teun van Schijndel, Chris Palmstrom

Characterization of Thin Films For Quantum Information Science Conventional

Bismuth (Bi) and aluminum (Al) thin films exhibit unique properties, such as high-quality Bi thin films with triangle-like structures and interconnected loops on the nanometer scale known as strain solitons [1], and an enhancement of superconductivity in Al thin films grown at cryogenic temperatures [2]. Yet, it remains unclear whether growing bismuth antimony (BiSb) thin films will yield a high-quality structure, as with Bi thin films, or whether capping Al thin films will alter the enhancement of superconductivity. Scanning tunneling microscopy (STM) was used to image surfaces at the nanoscale for BiSb thin films. For Al thin films, the Physical Properties Measurement System (PPMS) was used to obtain the critical temperatures for superconductivity. STM images suggested high-quality growth for BiSb thin films, and PPMS data suggested potential reduction of enhanced superconductivity for capped Al thin films. These results could be stepping stones for spintronics, low-power-loss electronics, and quantum computing.